INSPICO
High Resolution Analysis

Empowering Nanotechnology

At the forefront of nanotechnology innovation, we strive to meet the demands of an ever-miniaturizing world. Our mission is to provide cutting-edge tools in Atom Probe Tomography (APT) and Field Ion Microscopy (FIM) that unlock atomic-level insights and drive advancements in microelectronics, micromechanics, sensors, solar industry, and battery R&D. By delivering unparalleled 3D atomic resolution, we empower researchers and developers to create groundbreaking products and ensure superior quality control. Join us in shaping the future of nanotechnology.



Atom Probe Tomography enables you to unlock the atomic world in 3D

Explore our hardware products and see how INSPICO's expertise in atom probe technology can support your goals. From standard equipment to bespoke systems, we offer customized solutions tailored to your needs. Contact us for a no-obligation consultation and discover how our innovative approaches can enhance your projects.


Field Ion Microscope


  • Investigating tip surfaces with atomic resolution
  • 70 mm diameter real MCP based imaging detector
  • different imaging gases possible
  • additional chamber ports to allow customization of your experiment


ORBIS - Modular Atom Probe


  • modular design to be combined with your FIB or SEM instrument
  • allowing sample preparation without breaking vacuum conditions
  • allowing full cryogenic preparation of samples
  • different Laser-Options (ns, ps, fs , IR, Green, UV)
  • MCP Delay Line Detector with OAR of 70% or 90 %
ORBIS - Atom Probe


  • Airlock and Sample Storage Chamber
  • Port for additional chamber
  • Different Detector Option
  • HV- Puls Option and different Laser Options
Equipment / Custom


  • Based on your needs customization of your atom probe system is possible
  • ultra high vacuum furnance
  • Extnernal plunge freezer for hydrogen charging of APT samples



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