Nanotechnology is a key-technology, leading to various new products or product improvements. The ongoing technological trend of miniaturization demands control of processes on the atomic scale. This demand is already required in microelectronics, micromechanics, sensors, solarindustry or just to mention battery-R&D. To enable the development of nanotechnological products and assure quality control special microscopy and microscopes are needed. Especially if 3D information with atomic resolution is required.
Our ambition is to provide necessary tools to use Atom Probe Tomography (APT) and Field Ion Microscopy (FIM) to your needs.
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31.01.2020, 13:57
Scito v2.0 Beta released
Scito v2.0 Beta has been released to all Beta-Users mehr
27.11.2019, 12:58
Scito V1.40 available
Change: New graphical Render-Tree mehr
26.07.2019, 22:48
Trail - Test Version available
We are happy to give you the Test-Version of Scito. Help us to improve further mehr
04.07.2019, 23:54
Java Scripting in Scito implemented
