Inspico High Resolution Analysis
Dedicated Instruments:  Field Ion Microscopy & Atom Probe Tomography



Nanotechnology is a key-technology, leading to various new products or product improvements. The ongoing technological trend of miniaturization demands control of processes on the atomic scale. This demand is already required in microelectronics, micromechanics, sensors, solarindustry or just to mention battery-R&D. To enable the development of nanotechnological products and assure quality control special microscopy and microscopes are needed. Especially if 3D information with atomic resolution is required.

 

Our ambition is to provide necessary tools to use Atom Probe Tomography (APT) and Field Ion Microscopy (FIM) to your needs.


 

News

Feed

31.01.2020, 13:57

Scito v2.0 Beta released

Scito v2.0 Beta has been released to all Beta-Users   mehr


27.11.2019, 12:58

Scito V1.40 available

Change: New graphical Render-Tree   mehr


26.07.2019, 22:48

Trail - Test Version available

We are happy to give you the Test-Version of Scito. Help us to improve further   mehr


04.07.2019, 23:54

Java Scripting in Scito implemented

   mehr




 

Results

Which other scripting language would you prefer next

  c++   python   c#


Coming soon


Demo Version of Scito

Datum:26.07.2019



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