Inspico High Resolution Analysis
Dedicated Instruments:  Field Ion Microscopy & Atom Probe Tomography



Nanotechnology is a key-technology, leading to various new products or product improvements. The ongoing technological trend of miniaturization demands control of processes on the atomic scale. This demand is already required in microelectronics, micromechanics, sensors, solarindustry or just to mention battery-R&D. To enable the development of nanotechnological products and assure quality control special microscopy and microscopes are needed. Especially if 3D information with atomic resolution is required.

 

Our ambition is to provide necessary tools to use Atom Probe Tomography (APT) and Field Ion Microscopy (FIM) to your needs.


 

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26.07.2019

Trail - Test Version available

We are happy to give you the Test-Version of Scito. Help us to improve further



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26.07.2019
Demo Version of Scito
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16.12.2019
Scito V 1.50
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